ISO IEC 10373-3:2018 pdf download.Identification cards Test methods Part 3: Integrated circuit cards with contacts and related interface devices.
ISO IEC 10373-3 defines test methods for characteristics of integrated circuit cards with contacts and related interface devices according to the definition given in ISO/IEC 7816-3. Each test method is cross-referenced to one or more base standards, which can be ISO/IEC 7810 that defines the information storage technologies employed in identification card applications.
NOTE Criteria for acceptability do not form part of this document but can be found in the International Standards mentioned above.
ISO IEC 10373-3 defines test methods which are specific to integrated circuit technology with contacts. ISO/IEC 10373-1 defines test methods which are common to one or more card technologies and other parts of the ISO/fEC 10373 series define other technology-specific tests.
Test methods defined in this document are intended to be performed separately and independently. A given card is not required to pass through all the tests sequentially. The test methods defined in ISO IEC 10373-3 are based on ISO/IEC 7816-3.
Conformance of cards and IFDs determined using the test methods defined in ISO IEC 10373-3 does not preclude failures in the field. Reliability testing is outside the scope of ISO IEC 10373-3.
Testing of the DUT as defined in Clauses 6, 7 and requires a Test Scenario to be executed. This Test Scenario is a “typical protocol and application specific communication”, dependent on the protocol and application specific functionality foreseen for the normal use of and implemented in the DUT.
The Test Scenario shall be defined by the entity carrying out these tests and shall be documented with the test-results. The Test Scenario shall encompass a representative subset or preferably, if practical, the full functionality of the DUT expected to be utilized during normal use. The Test Scenario shall have a duration of at least 1 s.
The testing entity may require information about the implemented protocol and functionality as well as the intended use of the DUT to enable the testing entity to define a Test Scenario.
I
Power down the card.
f) Set the card-test-apparatus to the parameters shown in Table 42.
g) Resetthe card.
h) Run the Test Scenario. During this communication the characteristics and values shown in Table 43 shall be continuously monitored and the values determined.
i) Power down the card.
j) Repeat steps b) to I) for all supported voltage classes.
5.2.4 Test report
Report the capacitance of the 1/0-contact, the values determined in the procedure and whether all communications were in conformance with ISO/IEC 78 16-3.ISO-IEC-10373-3-2018